会社案内
研究業績 - 「投稿論文」
投稿論文（英文）
1) T. Tadokoro, T. Fukazawa, and H. Toriumi: "Real Time Measurement of Liquid Crystal Reorientation Dynamics Using Polarization Modulated Spectroellipsometry", Jpn. J. Appl. Phys., 36 (1997) pp.L1207-L1210.
2) T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara: "High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope", Jpn. J. Appl. Phys., 39 (2000) pp.3599-3602.
3) T. Tadokoro, K, Akao, T. Yoshihara, S. Okutani, M. Kimura, T. Akahane and H. Toriumi: "Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface studied by Total-Reflection Ellipsometry", Jpn. J. Appl. Phys., 40 (2001) pp.L453-L455.
4) T. Tadokoro, K. Akao, S. Outani, M. Kimura, T. Akahane and H. Toriumi: "Surface Orientation of Liquid Crystals: Director Fluctuation and Optical Flickering Effect in Nematic Liquid Crystals studied by Total-Reflection Spectroellipsometry", Thin Solid Films, 393 (2001) pp.53-58.
5) T. Tadokoro, T. Saiki and H. Toriumi: "Design and Implementation of Near-Field Scanning Optical Microscope for Interfacial Liquid Crystal Observation", Jpn. J. Appl. Phys., 41 (2002) pp.L152-L154.
6) T. Tadokoro, T. Saiki and H. Toriumi: "Two-Dimensional Analysis of Liquid Crystal Orientation at In-Plane Switching SubstrateSurface Using a Near-Field Scanning Optical Microscope", Jpn. J. Appl. Phys., 42 (2003) pp.L57-L59.
7) T. Tadokoro, K. Akao, S. Okutani, M. Kimura, T. Akahane and Toriumi: "Quantitative Analysis of Nematic Director Reorientation Dynamics Studied by Time-Resolved Spectroscopic Ellipsometry", Jpn. J. Appl. Phys., 42 (2003) pp.4552-4563.
投稿論文（和文）
1) 田所利康：「近接場光学顕微鏡を用いた界面液晶配向の電場応答観察」日本液晶学会誌 EKISHO, 5, 4 (2001) pp299-307.
2) 田所利康，木村宗弘，赤羽正志，鳥海弥和：「全反射エリプソメトリーによる界面液晶ダイナミクスの観察」，応用物理，73, 6 (2004) pp.759-763.
3) 田所利康：「液晶界面配向転移ダイナミクスの全反射エリプソメトリー測定」，光学，34, 5 (2005) pp.261-263.
4) 田所利康：「入門講座 やさしいトライボ表面分析(12)：エリプソメトリー」，トライボロジスト，51, 6 (2006) pp.450-455.
5) 田所利康：「分光エリプソメトリー：基礎から応用まで」, 日本画像学会誌, 50, 5 (2011) pp.439-447.
関連論文（英文）
1) T. Fukazawa, T. Tadokoro, T. Toriumi, T. Akahane and M. Kimura: "Application of Time-resolved Spectroellipsometry to the Study of Liquid Crystal Reorientation Dynamics", Thin Solids Films, 313/314 (1998) pp.799-802.
2) Y. Narita, T. Tadokoro, T. Ikeda, T. Saiki, S. Mononobe and M. Ohtsu: "Near-Field Raman Spectral Measurement of Polydiacetylene", Appl. Spectrosc., 52, 9 (1998) pp.1141-1144.
3) Y. Narita, T. Tadokoro, T. Ikeda, T. Saiki, S. Mononobe, and M. Ohtsu: "Subwavelength Spatial Resolution Measurement Using Near-Field Spectrometers", American Laboratory News Edition 31 (1999) pp.21-24.
4) S. Okutani, M. Kimura, T. Akahane, H. Toriumi, T. Tadokoro and K. Akao: "Investigation fo Interfacial Liquid Crystal Orientation by Reflection Ellipsometry", Mol. Cryst. Liq. Cryst., 329 (1999) pp.269-281.
5) S. Okutani, M. Kimura, T. Akahane, T. Tadokoro, K. Akao and Toriumi: "Observation of Nematic Liquid Crystal Director Reorientation at the Interface between Substrate and Liquid Crystal Layer by Total Reflection Ellipsometry", Jpn. J. Appl. Phys., 40 (2001) pp.244-249.
6) M. Kimura, S. Okutani, T. Churiki, T. Akahane, H. Toriumi and T. Tadokoro: "Determination of the Birefringence, the Twist Angle and the Thickness of the Nematic Liquid Crystal Sample by Renormalized Transmission Ellipsometry", Mol. Cryst. Liq. Cryst., 367 (2001) pp. 681-689.
7) S. Okutani, M. Kimura, T. Akahane, H. Toriumi, T. Tadokoro and K. Akao: "Analysis of Electrical Response of Nematic Liquid Crystal by Ellipsometry", Mol. Cryst. Liq. Cryst., 367 (2001) pp.691-700.
8) S. Okutani, M. Kimura, H. Toriumi, K. Akao, T. Tadokoro and T. Akahane: "Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry", Jpn. J. Appl. Phys., 40 (2001) pp.3288-3293.
9) M. Sakai, S. Mononobe, K. Yusu, T. Tadokoro and T. Saiki: "Observation of Amorphous Recording Marks Using Reflection-Mode Near-Field Scanning Optical Microscope Supported by Optical Interference Method", Jpn. J. Appl. Phys., 44 (2005) pp.6855-6858.
10) Y.Okumoto, N.Matsuhashi, M. Yoshida, T. Tadokoro, M.Kimura and T.Akahane, "Investigation of refractive indices of Free-Standing Films by ellipsometry", Molecular Crystals and Liquid Crystals, 413 (2004) pp.91-98.
11) T. Sato, T. Araki, Y. Sasaki, T. Tsuru, T. Tadokoro and S. Kawakami: "Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements", Appl. Opt., 46 (2007) pp.4963-4967.
12) H. Shima, T. Kawae, A. Morimoto, M. Matsuda, M. Suzuki, T. Tadokoro, H. Naganuma, T. Iijima, T. Nakajima and S. Okamura: "Optical Properties of BiFeO3-System Multiferroic Thin Films", Jpn. J. Appl. Phys., 48 (2009) pp.09KB01-1-4.
13) T. Tsuru, Y. Kubota, T. Tadokoro, S. Kawabata: "Development of spectroscopic transmission-type four detector polarimeter", Thin Solid Films, 519 (2011) pp.2707-2710.
14) A. Yamamoto, T. Miwa, M. Kawai, T. Tadokoro, K. Tsutsumi, T. Sato, S. Kodama, and K. Hayakawa: "Development of a Variable-wavelength Optical Rotation Detector in the Ultraviolet Region", Anal. Sci., 27 (2011) pp.799-803.
15) H. Shima, K. Tsutsumi, M. Suzuki, T. Tadokoro, H. Naganuma, T. Iijima, K. Nishida, T. Yamamoto, T. Nakajima and S. Okamura: "Themooptic Property of Polycrystalline BiFeO3 Film", Jpn. J. Appl. Phys., 50 (2011) pp.09NB02-1-4.
